UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEC/TR 62433-2-1

EMC IC modelling – Part 2-1: Theory of black box modelling for conducted emission

active, Most Current
Buy Now
Organization: IEC
Publication Date: 1 October 2010
Status: active
Page Count: 64
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 62433-2-1 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors.

This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.

Document History

IEC/TR 62433-2-1
October 1, 2010
EMC IC modelling – Part 2-1: Theory of black box modelling for conducted emission
This part of IEC 62433-2-1 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary...

References

This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
This document references:
IEC 61967-1 - Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General Conditions and Definitions
Published by IEC on December 1, 2018
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description...
This document references:
IEC 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by IEC on September 1, 2005
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is...
This document references:
IEC/TS 62404 - Logic digital integrated circuits – Specification for I/O interface model for integrated circuit (IMIC version 1.3)
Published by IEC on February 1, 2007
A description is not available for this item.
This document references:
IEC 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by IEC on February 1, 2003
This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board...
This document references:
IEC 61967-6 - Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1
Published by IEC on August 1, 2010
A description is not available for this item.
This document is referenced by:
IEC 62433-1 - EMC IC MODELLING – Part 1: General modelling framework CORRIGENDUM 1
Published by IEC on July 1, 2020
A description is not available for this item.
View Less
View All
Advertisement