Standard Practice for Qualification and Long-Term Stability of Computed Radiology Systems
|Publication Date:||1 June 2005|
This practice specifies the fundamental parameters of computed radiography systems to assure satisfactory and repeatable results for nondestructive testing.
This practice describes the evaluation of Computed Radiology (CR) systems for industrial radiography. It is intended to ensure that the evaluation of image quality, as far as this is influenced by the scanner/IP system, meets the needs of users and enables the test of long-term stability.
Each of the tests described may be performed with individual gages specified. The user shall decide which tests shall be used for system control using individual test objects or the CR test phantom2 (Appendix X1). The computed radiological tests, specified as "user tests" in this practice, may be utilized at appropriate intervals determined by the user, based on the application of the examination operations. The tests shall be appropriate for the materials and range of use of the system. Fading, uniformity, and erasure tests shall also be part of the control system. All other tests for qualification and capability are to be performed and certified by the CR equipment manufacturer.
The values stated in SI units are to be regarded as the standard. Values in inch-pound units are for information purposes.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2 The sole source of supply of the apparatus known to the committee at this time is Nuclear Associates, A Division of Cardinal Health, 120 Andrews Road, Hicksville, NY 11801, Phone: 1-888-466-8257, Catalog Number: 07-605-2435. If you are aware of alternative suppliers, please provide this information to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the responsible technical committee,1 which you may attend.