DIN EN 61967-6
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
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| Organization: | DIN |
| Publication Date: | 1 February 2011 |
| Status: | active |
| Page Count: | 2 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History
DIN EN 61967-6
February 1, 2011
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
A description is not available for this item.
October 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
A description is not available for this item.
May 1, 2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method (IEC 61967-6:2002); German version EN 61967-6:2002
A description is not available for this item.
March 1, 2000
Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 6: Measurement of RF currents, magnetic probe method (IEC 47A/568/CD:1999)
A description is not available for this item.
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