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BSI - BS IEC 60747-14-4

Semiconductor devices - Discrete devices Part 14-4: Semiconductor accelerometers

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Organization: BSI
Publication Date: 28 February 2011
Status: active
Page Count: 102
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS IEC 60747-14-4
February 28, 2011
Semiconductor devices - Discrete devices Part 14-4: Semiconductor accelerometers
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References

This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published by IEC on April 1, 2017
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
This document references:
IEC 60749-25 - Semiconductor devices Mechanical and climatic test methods Part 25: Temperature cycling
Published by IEC on July 1, 2003
This part of IEC 60749 provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating...
This document references:
IEC 61000-4-3 - Electromagnetic compatibility (EMC) – Part 4-3: Testing and measurement techniques – Radiated, radio-frequency electromagnetic field immunity test
Published by IEC on September 1, 2020
This part of IEC 61000 is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test...
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