Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
|Publication Date:||1 January 2011|
|ICS Code (Semiconductor devices in general):||31.080.01|
This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.