AFNOR - NF EN 60191-6-19
Mechanical standardization of semiconductor devices - Part 6-19 : measurement methods of package warpage at elevated temperature and the maximum permissible warpage
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 November 2010 |
| Status: | active |
| ICS Code (Electronic components in general): | 31.020 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60191-6-19
November 1, 2010
Mechanical standardization of semiconductor devices - Part 6-19 : measurement methods of package warpage at elevated temperature and the maximum permissible warpage
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