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NPFC - MIL-S-19500/104

SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124RA, 1N1126RA, 1N1128RA, 1N3649R, AND 1N3650R

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Organization: NPFC
Publication Date: 17 August 1962
Status: inactive
Page Count: 7

Document History

MIL-S-19500/104
December 10, 1999
SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124RA, 1N1126RA, 1N1128RA, 1N3649R, AND 1N3650R
A description is not available for this item.
MIL-PRF-19500/104C NOTICE 1
June 7, 1999
SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124RA, 1N1126RA, 1N1128RA, 1N3649R, AND 1N3650R
A description is not available for this item.
MIL-S-19500/104
November 29, 1965
SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124RA, 1N1126RA, 1N1128RA, 1N3649R, AND 1N3650R
This specification covers the detail requirements for 1 amp, silicon, power rectifiers with the following ratings: Reverse and forward types are identical except: The forward types have the cathode...
MIL-S-19500/104
August 17, 1962
SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124RA, 1N1126RA, 1N1128RA, 1N3649R, AND 1N3650R
A description is not available for this item.

References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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