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IEC 60679-6

Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines

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Organization: IEC
Publication Date: 1 March 2011
Status: inactive
Page Count: 46
ICS Code (Piezoelectric devices): 31.140
scope:

This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

The measuring frequency range is from 10 MHz to1 000 MHz.

This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as "oscillator(s)" for simplicity.

Document History

IEC 60679-6
March 1, 2011
Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows...
February 1, 2008
Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide
A description is not available for this item.

References

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