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BSI - BS EN 15991

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

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Organization: BSI
Publication Date: 28 February 2011
Status: inactive
Page Count: 32
ICS Code (Raw materials): 81.060.10

Document History

BS EN 15991
November 30, 2015
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
A description is not available for this item.
BS EN 15991
February 28, 2011
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
A description is not available for this item.

References

This document references:
ISO 5022 - Shaped Refractory Products - Sampling and Acceptance Testing
Published by ISO on January 1, 1979
A description is not available for this item.
This document references:
ISO 8656-1 - Refractory Products - Sampling of Raw Materials and Unshaped Products - Part 1: Sampling Scheme First Edition
Published by ISO on January 1, 1988
A description is not available for this item.
This document references:
BS ISO 5725-2 - Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
Published by BSI on December 31, 2019
A description is not available for this item.
This document references:
EN ISO 21068-1 - Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation
Published by CEN on August 1, 2008
A description is not available for this item.
This document references:
ISO 5725-4 - Accuracy (trueness and precision) of measurement methods and results — Part 4: Basic methods for the determination of the trueness of a standard measurement method
Published by ISO on March 1, 2020
This document — specifies basic methods for estimating the bias of a measurement method and the laboratory bias when a measurement method is applied; — provides a practical approach of a basic method...
This document references:
ISO/IEC GUIDE 98-3 FRENCH - Incertitude de mesure - Partie 3: Guide pour l'expression de l'incertitude de mesure (GUM:1995)
Published by ISO on January 1, 2008
A description is not available for this item.
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