DIN 50443-2
Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 June 1994 |
| Status: | inactive |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50443-2
June 1, 1994
Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds
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