AENOR - UNE-EN 62047-3
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 January 2007 |
| Status: | active |
| Page Count: | 12 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
UNE-EN 62047-3
January 1, 2007
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
A description is not available for this item.