AENOR - UNE-EN 60749-38
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 September 2008 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-38
September 1, 2008
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
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