AENOR - UNE-EN 62418
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 October 2010 |
| Status: | active |
| Page Count: | 20 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 62418
October 1, 2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
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