AENOR - UNE-EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 September 2011 |
| Status: | active |
| Page Count: | 21 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
UNE-EN 62047-8
September 1, 2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
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