scope:

This part of IEC TS 62804 defines procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high-voltage stress in a damp heat environment referred to as potential-induced degradation (PID). This part is designed for thin-film PV modules and modules containing moisture sensitive films protected by vapour barrier packaging, principally with one or two glass surfaces. This part tests for degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected. This part does not specifically test for electrochemical corrosion or delamination associated with application of system voltage. This part does not contain pass or fail criteria and it is not intended for design qualification.