AENOR - UNE-EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)
inactive, Most Current
| Organization: | AENOR |
| Publication Date: | 1 February 2008 |
| Status: | inactive |
| Page Count: | 25 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 62374
February 1, 2008
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)
A description is not available for this item.