AENOR - UNE-EN 15991
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
inactive
| Organization: | AENOR |
| Publication Date: | 1 March 2011 |
| Status: | inactive |
| Page Count: | 29 |
| ICS Code (Raw materials): | 81.060.10 |
Document History
January 1, 2016
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)
A description is not available for this item.
UNE-EN 15991
March 1, 2011
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
A description is not available for this item.