AENOR - UNE-EN IEC 60749-12
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 April 2018 |
| Status: | active |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN IEC 60749-12
April 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
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