AENOR - UNE-EN 60749-39
Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 November 2006 |
| Status: | active |
| Page Count: | 13 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-39
November 1, 2006
Semiconductor devices - Mechanical and climatic test methods -- Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
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