AENOR - UNE-EN 60749-21
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 November 2011 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-21
November 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
A description is not available for this item.
August 1, 2005
Semiconductor devices - Mechanical and climatic test methods -- Part 21: Solderability (Endorsed by AENOR in August of 2005.)
A description is not available for this item.