AENOR - UNE-EN 60749-37
Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 July 2008 |
| Status: | active |
| Page Count: | 23 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-37
July 1, 2008
Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
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