AENOR - UNE-EN 62374-1
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 March 2011 |
| Status: | active |
| Page Count: | 19 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
UNE-EN 62374-1
March 1, 2011
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
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