AENOR - UNE-EN 61967-6/A1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 September 2008 |
| Status: | active |
| Page Count: | 23 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History
UNE-EN 61967-6/A1
September 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
A description is not available for this item.
November 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
A description is not available for this item.