AENOR - UNE-EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 November 2014 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
| ICS Code (Other graphical symbols): | 01.080.99 |
Document History
UNE-EN 62047-22
November 1, 2014
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
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