AENOR - UNE-EN 61189-5-503
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 September 2017 |
| Status: | active |
| Page Count: | 33 |
| ICS Code (Printed circuits and boards): | 31.180 |
Document History
UNE-EN 61189-5-503
September 1, 2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)
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