AENOR - UNE-EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 November 2006 |
| Status: | active |
| Page Count: | 17 |
| ICS Code (Transistors): | 31.080.30 |
Document History
UNE-EN 62373
November 1, 2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)
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