AENOR - UNE-EN IEC 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 May 2018 |
| Status: | active |
| Page Count: | 23 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN IEC 60749-13
May 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
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