AENOR - UNE-EN 60749-27/A1
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 January 2013 |
| Status: | active |
| Page Count: | 11 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-27/A1
January 1, 2013
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
A description is not available for this item.
November 1, 2006
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
A description is not available for this item.