DIN 50435
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 May 1988 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50435
May 1, 1988
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
A description is not available for this item.
Related Products
Searching for related products...