DIN IEC 60749-21
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 June 2002 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-21
June 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
A description is not available for this item.