DIN IEC 47E(Sec)4
Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 1994 |
| Status: | inactive |
| ICS Code (Transistors): | 31.080.30 |
Document History
DIN IEC 47E(Sec)4
April 1, 1994
Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)
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