DIN 50454-3
Testing of materials for semiconductor technology - Determination of the dislocation etch pits density in monocrystals of III-V-compound semiconductors - Part 3: Gallium phosphide
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 October 1994 |
| Status: | inactive |
| Page Count: | 2 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50454-3
October 1, 1994
Testing of materials for semiconductor technology - Determination of the dislocation etch pits density in monocrystals of III-V-compound semiconductors - Part 3: Gallium phosphide
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