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IEC - 62951-6

Semiconductor devices – Flexible and stretchable semiconductor devices – Part 6: Test method for sheet resistance of flexible conducting films

active, Most Current
Organization: IEC
Publication Date: 1 May 2019
Status: active
Page Count: 54
ICS Code (Other semiconductor devices): 31.080.99
scope:

This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Document History

62951-6
May 1, 2019
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 6: Test method for sheet resistance of flexible conducting films
This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the...

References

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