DIN IEC 61164
Reliability growth in product design and test - Statistical test and estimation methods (IEC 56/774/CD:2001), text in English
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 February 2002 |
| Status: | inactive |
| ICS Code (Quality in general): | 03.120.01 |
| ICS Code (Electrical engineering in general): | 29.020 |
Document History
DIN IEC 61164
February 1, 2002
Reliability growth in product design and test - Statistical test and estimation methods (IEC 56/774/CD:2001), text in English
A description is not available for this item.
References
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