DIN 50433-1
Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 December 1976 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50433-1
December 1, 1976
Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
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