DIN IEC 47(CO)1117
IEC-Q-quality assessment system for electronic components; capability approval procedure; identical with IEC 47(Central Office)1117
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 August 1991 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 47(CO)1117
August 1, 1991
IEC-Q-quality assessment system for electronic components; capability approval procedure; identical with IEC 47(Central Office)1117
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