DIN IEC 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/1682/CD:2003)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 June 2003 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-30
June 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/1682/CD:2003)
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