AFNOR - NF EN IEC 60749-17
Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 10 May 2019 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN IEC 60749-17
May 10, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
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