DIN 50436
Testing of semi-conducting inorganic materials - Measurement of the metalurgic thickness of epitaxial layers of silicon by the stacking fault method
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 October 1976 |
| Status: | inactive |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50436
October 1, 1976
Testing of semi-conducting inorganic materials - Measurement of the metalurgic thickness of epitaxial layers of silicon by the stacking fault method
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