DIN IEC 47(Sec)1234
Semiconductor devices; destructive test; term and definition; identical with IEC 47(Secretariat)1234
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 1992 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 47(Sec)1234
April 1, 1992
Semiconductor devices; destructive test; term and definition; identical with IEC 47(Secretariat)1234
A description is not available for this item.
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