DIN V 32938
Surface profiling by means of optical microscopic methods - Concepts and measurement procedures
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 January 1998 |
| Status: | inactive |
| Page Count: | 11 |
| ICS Code (Metrology and measurement. Physical phenomena (Vocabularies)): | 01.040.17 |
| ICS Code (Properties of surfaces): | 17.040.20 |
Document History
DIN V 32938
January 1, 1998
Surface profiling by means of optical microscopic methods - Concepts and measurement procedures
A description is not available for this item.
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