UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DIN 50438-2

Pruefung von Materialien fuer die Halbleitertechnologie; Bestimmung des Verunreinigungsgehaltes in Silicium mittels Infrarot-Absorption; Kohlenstoff

inactive, Most Current
Organization: DIN
Publication Date: 1 August 1982
Status: inactive
Page Count: 5
ICS Code (Semiconducting materials): 29.045

Document History

DIN 50438-2
August 1, 1982
Pruefung von Materialien fuer die Halbleitertechnologie; Bestimmung des Verunreinigungsgehaltes in Silicium mittels Infrarot-Absorption; Kohlenstoff
A description is not available for this item.

References

This document is referenced by:
BS EN 50513 - Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
Published by BSI on October 31, 2009
A description is not available for this item.

Related Products

Searching for related products...

Advertisement