DIN 50438-1
Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 July 1995 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50438-1
July 1, 1995
Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
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