DIN 50456-2
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 1995 |
| Status: | inactive |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50456-2
April 1, 1995
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test
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