DIN IEC 47(CO)1044
Digital integrated circuits; terms and description of test patterns for memory testing; identical with IEC 47(Central Office)1044
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 January 1989 |
| Status: | inactive |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History
DIN IEC 47(CO)1044
January 1, 1989
Digital integrated circuits; terms and description of test patterns for memory testing; identical with IEC 47(Central Office)1044
A description is not available for this item.
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