DIN 50441-1
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 July 1996 |
| Status: | inactive |
| Page Count: | 4 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50441-1
July 1, 1996
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
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