DIN 50440
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 November 1998 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Semiconducting materials): | 29.045 |
Document History
DIN 50440
November 1, 1998
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
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