DIN IEC 47(CO)1116
Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 May 1989 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 47(CO)1116
May 1, 1989
Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205
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