DIN IEC 47(CO)1187
Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 September 1991 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 47(CO)1187
September 1, 1991
Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187
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