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VDI - VDE/VDI 2604

Oberflaechen-Messverfahren; Rauheitsuntersuchung mittels Interferenzmikroskopie

inactive, Most Current
Organization: VDI
Publication Date: 1 June 1971
Status: inactive
Page Count: 11
ICS Code (Properties of surfaces): 17.040.20

Document History

VDE/VDI 2604
June 1, 1971
Oberflaechen-Messverfahren; Rauheitsuntersuchung mittels Interferenzmikroskopie
A description is not available for this item.

References

This document is replaced by:
VDI/VDE 2655 BLATT 1.2 - Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurement
Published by VDI on October 1, 2010
The present guideline applies to confocal microscopes for measuring the topography of technical surfaces. The procedures described for the calibration can be compared with the methods which have...

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